用偶极子自洽场理论模拟计算了反射式近场光学扫描显微镜中入射光的偏振特性对近场成像结果的影响(包括系统分辨率和相关的成像特性),并给予了相应的分析和解释。分析计算结果表明,入射光偏振性的选择将影响近场光学显微镜的成像质量。在近场区域,用垂直于样品表面偏振的入射光(即z方向偏振)照明成像将得到优于相应水平偏振(即x方向偏振)的入射光照明的系统分辨率。用x方向偏振的入射光照明时,所得光学图像会发生局部的光强对比度反转。

Based on the dipole-self-consistent field theory the influence of polarization of the incident light on the imaging quality of reflection mode SNOM is simulately calculated such as the system resolution and the image quality, and the theoretical explanation is given. The analysis result shows that the imaging quality greatly depends on the polarization of incident light at the probe tip of the microscope. In the near field imaging, the system resolution is better when the incident light is polarized vertically to the surface (via z-axis polarized) than that when it is horizontally polarized. When the incident light is x-axis polarized, the imaging achieved by scanning the object can reverse locally in contrast.