光学学报, 2004, 24 (9): 1159, 网络出版: 2006-06-12   

基于折反射原理的层去反求技术研究

A New Slicing Method Based on The Principle of Refraction and Reflection
作者单位
1 西安交通大学生物医学信息工程教育部重点实验室, 西安 710049
2 西安交通大学机械制造系统工程国家科学重点实验室,西安 710049
摘要
为了克服传统层去反求测量中图像衬比度较低的缺陷,提出一种新的基于棱镜反射原理的层去反求图像摄取方法。该方法利用棱镜的全发射和折射作用提高图像衬比度,根据物体反射率的高低可分别采用垂直照明和倾斜照明,分别可获得高衬比度的亮目标暗背景和暗目标亮背景图像,为了校正由于折反射引入的几何变形,推出了相应的数学变换模型。该研究已成功投入实际产品校正的应用中,研究表明这种新的层去法比起传统的层去法不仅在于图像衬比度高,而且物体截面图像的轮廓更清晰可靠、无需填充反差材料,有望在零件及模型的反求测量中发挥较大的作用。
Abstract
To overcome the disadvantage of low contrast in the images taken with the traditional slicing method of reverse engineering, a novel slicing method of reverse engineering based on the principle of refraction and reflection of a prism is proposed to improve the contrast of the cross-sectional images. According to the reflectivity of the object, one of the illuminating methodsstraight illuminating or inclined illuminatingis adopted to get the sharp contrast images of bright object in dark background, or dark object in bright background. To adjust geometrical distortions caused by the refraction and reflection of the prism, a mathematical transformation model is set up to correct the image by means of software. This method has been applied to some cases of reverse measuring. The research confirms that this new slicing method has not only the advantage of high contrast, but also the clear and reliable contours of the cross-sectional images, what's more, there is no need of contrasting filling materials. It is hopeful that this method will play a great role in the reverse measuring of mechanical parts and models.

刘亚雄, 段玉刚, 卢秉恒, 李涤尘, 王珏. 基于折反射原理的层去反求技术研究[J]. 光学学报, 2004, 24(9): 1159. 刘亚雄, 段玉刚, 卢秉恒, 李涤尘, 王珏. A New Slicing Method Based on The Principle of Refraction and Reflection[J]. Acta Optica Sinica, 2004, 24(9): 1159.

本文已被 1 篇论文引用
被引统计数据来源于中国光学期刊网
引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!