激光与光电子学进展, 2006, 43 (3): 56, 网络出版: 2006-04-20
X射线荧光层析
X-ray Fluorescence Tomography
摘要
X射线荧光层析技术是利用内壳层电子跃迁所发出荧光辐射,来测定样品中的元素含量,获取样品内部的结构信息。Wolter型掠入射镜装置的元素灵敏度可以达到106个原子/cm3,空间分辨率达到微米量级。结合康普顿散射和吸收层析进行成像可使其图像质量得到进一步的提高。而当获得了物体的投影数据以后,可采用各种重建算法来使物体得以准确重现。介绍了几种常用的重建算法,并就其特点进行了比较。
Abstract
The X-ray fluorescence tomography method is capable of virtually estimating the concentration of elements and obtaining the inner structure of materials by measuring the intensity of fluorescence which is emitted by the inner shell electron. Using a Wolter-type grazing-incidence mirror, the sensitivity of the element can reach 106 atom/cm3 and the space resolution can reach the magnitude of micron. Additionally, with Compton scattering and absorption tomography, the image quality can be further improved. Then several kinds of reconstruction algorithms are introduced and their characteristics are compared.
干慧菁, 高鸿奕, 朱化凤, 陈建文, 朱佩平, 冼鼎昌. X射线荧光层析[J]. 激光与光电子学进展, 2006, 43(3): 56. 干慧菁, 高鸿奕, 朱化凤, 陈建文, 朱佩平, 冼鼎昌. X-ray Fluorescence Tomography[J]. Laser & Optoelectronics Progress, 2006, 43(3): 56.