量子电子学报, 2000, 17 (1): 81, 网络出版: 2006-05-15
激光烧蚀介质薄膜情况下的单光束扫描法
The Influence of Ablation of Film Materials by Laser onZ-scan Measurement
摘要
用单光束扫描法研究薄膜材料的非线性光学性质时,如果入射样品的激光功率过大,将会烧蚀薄膜而产生孔洞,虽然其归一化透过率曲线类似于没有烧蚀的情况,但与样品的非线性光学性质无关,因而造成测量结果错误。本文从理论上分析了因孔洞而产生的正透镜或负透镜效应并给出了归一化透过率的表达式。
Abstract
During the measurement of optical nonlinearities of sample in the thin film by Z-scan technique, ablating makes a hole in the thin film if the incidental laser power is too high, that will produce the error to measurement results. We analyze the positive and negative lens effect caused by the hole theoretically and give the expression of normalized transmittance in this condition.
贾振红, 李劬. 激光烧蚀介质薄膜情况下的单光束扫描法[J]. 量子电子学报, 2000, 17(1): 81. 贾振红, 李劬. The Influence of Ablation of Film Materials by Laser onZ-scan Measurement[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 81.