光子学报, 2006, 35 (6): 0919, 网络出版: 2010-06-03  

移相器微位移旋转误差的分析及测试

Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter
作者单位
南京理工大学电光学院,江苏 南京 210094
摘要
以压电陶瓷(PZT)微位移器为主要研究对象,引入一种处理静态干涉图的新方法——虚光栅移相叠栅条纹法,设计实验对一台实际使用的移相器微位移旋转误差进行测试研究,对其引起的波面旋转情况进行了定量的计算分析,并给出测试结果.用虚光栅移相叠栅条纹法处理实验中加有载频的干涉图时,不需要使用任何移相器件,可以进行动态位相的检测,整个移相过程用计算机进行控制,避免了引入额外的移相误差.
Abstract
Based on the theory of linear polynomial fitting algorithm,the micro-displacement error of phase-shifter which can induce the rotation of fringes in the processing of phase shift is analyzed. A novel method for static interferogram analysis,named the virtual grating phase-shifting moiré fringe method that is based on virtual grating technology,phase-shifting interferometry and moiré technology,is introduced and analyzed. When the static interferogram with a certain spatial frequency in the experiment is processed by this method,the phase shift is introduced mathematically and controlled by the computer to avoid any phase-shifting error,so the dynamic phase could be evaluated. Some valuable experiments are carried out and the results are presented to show the feasibility of this error-analysis method. In terms of error analysis,the criterions to control the error are presented.

武旭华, 陈磊, 颜加军. 移相器微位移旋转误差的分析及测试[J]. 光子学报, 2006, 35(6): 0919. Wu Xuhua, Chen Lei, Yan Jiajun. Analysis and Test on Rotation Error Induced by the Micro-displacement of Phase-shifter[J]. ACTA PHOTONICA SINICA, 2006, 35(6): 0919.

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