为了测量液晶双折射率, 从偏光干涉的理论公式入手, 通过一定的近似, 采用偏光干涉法测量液晶双折射率, 进行了理论分析和实验验证, 获得了较为理想的数据。结果表明, 在采用偏光干涉法测量液晶材料的双折射率时, 避免了对透射光谱的绝对光强进行测量, 使得测量结果具有较高的精度。这一结果对液晶器件的设计、制作和使用是有帮助的。

In order to measure the liquid crystal birefringence, a simple and accurate method called polarization interferometry was used from the theoretical formula of polarized light interference and by making a certain approximation. More satisfactory data were achieved by theoretically analysis and experimental verification. The results show the use of polarized light interferometry to measure the liquid crystal material avoids the measurement of the absolute intensity of transmission spectrum, and has high accuracy. It is helpful for the design, manufacture and application of liquid crystal device.