Chinese Optics Letters, 2007, 5 (8): 477, Published Online: Aug. 8, 2007
Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites Download: 502次
显微 共焦显微 成像系统 三维图像获取 SiOx纳米微晶 180.0180 Microscopy 180.1790 Confocal microscopy 110.0110 Imaging systems 110.6880 Three-dimensional image acquisition
Abstract
We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole. This imaging technique offers an increased contrast and a high scattered light rejection. It is demonstrated that the contrast close to the Sparrow resolution limit is enhanced and the sectioning power are increased with respect to the linear confocal detection mode. An experimental implementation is presented and compared with the conventional linear confocal mode.
Gilbert Boyer, Karsten Plamann. Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites[J]. Chinese Optics Letters, 2007, 5(8): 477.