电荷耦合器件(CCD)作为一个将光学图像转换到电子学图像的传感器，其成像质量与辐射响应参数的性能直接相关。针对面阵CCD 越来越广泛的应用，提出利用“辐射响应矩阵”的概念和评价方法，表述面阵CCD 每个像元的辐射性能参数。分析该矩阵，明确矩阵各元素的物理意义，并将面阵CCD 每个像元的绝对辐射响应度、响应非线性度、暗噪声、信噪比以及非均匀性的数学关系与其物理含义一一对应。对面阵CCD DALSA-FTF6080M 进行辐射性能检测，并利用辐射响应矩阵计算出各像元的响应系数。以测试结果为例，讨论和描述该矩阵的应用结果。实验结果表明：使用辐射响应矩阵可以计算出面阵CCD 非均匀性为3.1%，该CCD 近似成线性响应，暗噪声为3.84。此方法实用，满足对面阵CCD 的客观评价。

As a sensor to convert image from optical to electrical signal, charge coupled device (CCD) has been paid much attention to its image quality which is directly related to the radiation response characteristic parameters. Since array CCD is gaining more and more popularity, a concept of“radiation response matrix” and an evaluation method are put forward, and used to describe radiation response of each pixel of CCD. By analyzing of this matrix, and clearly defining physical concept of each element, parameters such as absolute radiation response, non-linearity, dark noise, signal-to-noise of each pixel and non-uniformity of CCD are in one-to-one correspondence with mathematical relation of the matrix. Response characteristic coefficient of each pixel is obtained using the model of radiation response matrix analysis by a test on area CCD DALSAFTF6080M. One application of this matrix is demonstrated. Experimental results show that non-uniformity of this CCD is 3.1% , its response is linear, and its dark noise is 3.84. This method is feasible and practical, and it satisfies the requirement of the objective evaluation of array CCD.