提出一种基于半导体激光器泵浦Nd∶YAG微片激光器的回馈干涉系统，适合于非配合目标的位移和绝对距离测量。该测量系统包括移频回馈干涉光学系统，基于泵浦调制的微片激光器调频系统和相敏检波信号处理系统3部分。介绍了移频回馈干涉的原理，给出了位移测量和绝对距离测量应用的原理和测量方法，分析了测量的分辨率。实际测量了发黑工件表面的位移和绝对距离。实验结果表明，该回馈干涉系统灵敏度高，对被测表面反射率的要求很低，兼有对非配合目标的高分辨率位移测量和绝对距离测量的能力。

A laser feedback interferometric system for measuring both the displacement and absolute distance of non-cooperative objects is presented. The system is based on a laser-diode pumped Nd∶YAG microchip laser,and it is comprised of a frequency-shifted laser feedback interferometer,a frequency-modulated microchip laser based on pumping modulation and a phase-sensitive detection device. The principle of frequency-shifted laser feedback interference is introduced. The principle and method of displacement and absolute distance measurements are elaborated. The measurement resolution was analyzed. The displacement and absolute distance of a blacken workpiece surface were detected experimentally in the laboratory. The results prove that the interferometric system has high sensitivity and relaxed requirement for the reflectivity of the UUT surface,and meets the need of both displacement and absolute distance measurements for uncoupled objects.