光学与光电技术, 2008, 6 (2): 0063, 网络出版: 2010-05-24   

高性能激光全息防伪标识特性参数测量系统

A High Performance System for Measuring the Parameters of the Holographic Anti-Counterfeiting Labels
作者单位
天津大学精密仪器与光电子工程学院光电信息技术科学教育部重点实验室,天津 300072
摘要
提出了一种高性能激光全息防伪标识参数的检测方法,利用同一束光在分束器分成的反射光和透射光光强度比例恒定的性质,实时探测衍射方向光强和标识入射光强值,通过一维线性扫描实现激光全息防伪标识衍射效率和信噪比的自动测量。实验数据表明:入射光强测量值相对误差不超过0.29%;衍射效率及信噪比的测量值最大相对误差分别不超过0.81%和2.0%,比第一代检测仪采用的方法测量精度提高近一倍。该方法降低了对光源稳定度的要求,大大降低了激光器的成本,有利于测量仪器的推广。
Abstract
A new method is presented to measure the characteristic parameters of the laser holographic anti-counterfeiting label, with less dependency on the stability of source light. The He-Ne laser is used as the light source. Based on the nature that one beam of light can be divided into two beams at a fixed ratio, the source light is divided into the reflex and the transmission at the fixed ratio by a beam splitter. As the label is scanned automatically, the intensities of the reflex and the diffraction are measured online and in real time to get the diffraction efficiency and the SNR. The experimental data demonstrates that the relative error of the transmission intensity is not more than 0.29%; that of the SNR is less than 2.0%, and that of the diffraction efficiency is not more than 0.81%, which are approximately half the error of the original method.With the much lower cost of the laser, the high performance method is helpful to popularize the measurement system.

何瑾, 刘铁根, 孟卓, 杨莉珺. 高性能激光全息防伪标识特性参数测量系统[J]. 光学与光电技术, 2008, 6(2): 0063. HE Jin, LIU Tie-gen, MENG Zhuo, YANG Li-jun. A High Performance System for Measuring the Parameters of the Holographic Anti-Counterfeiting Labels[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2008, 6(2): 0063.

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