研究了Offner型成像光谱仪消像差结构的参量和性能.用几何法推导出Offner型成像光谱仪的波长使用范围、系统线色散以及光谱分辨率的计算公式；在理想像差条件下，分析了Offner型成像光谱仪光谱分辨率与入射狭缝的宽度、凸面光栅分辨率和探测器像元尺寸各个因素之间的关系;探讨了提高光谱分辨率采用的方法和技术，解决了光谱仪的各个参量和光谱分辨率之间的矛盾.研究表明：当系统像差很小可忽略时，通过减小狭缝宽度，有利于提高光谱分辨率； Offner型成像光谱仪的分辨率由入射狭缝宽度、光栅和CCD像元尺寸三者中分辨本领最低的参量确定.

The parameters and property of Offner imaging spectrometer were studied according to eliminating aberration structure. The calculating equations of measurable range of wavelength, linear dispersion and spectral resolution were deduced by geometry method based on eliminating aberration structure of Offner imaging spectrometer; the relationship of resolution and each factor were analyzed, these factors including width of entrance slit, convex grating resolution and pixel size of detector. When the system aberration was to be ignored, the spectral resolution could be enhanced by decreasing width of entrance slit , this conclusion was verified by imaging experiment. The techniques and methods of improving spectral resolution were summarized, the tradeoff balance between each parameter and spectral resolution were considered. The final conclusion was as follow: the resolution of Offner imaging spectrometer was determined by the lowest resolution of the entrance slit, convex grating and pixel size of CCD.