通过对大量Zara样品进行分析，构建了不良现象——对应原因(PhenomenonCause)的4种理论模式，并基于此理论设计了改善Zara的实验。通过分析发现：约5 μm左右可移动的Zara主要为摩擦工艺过程产生的碎屑;10~25 μm按压不动的Zara主要为取向膜涂覆过程中的颗粒引起; 轮廓清晰尺寸较大的Zara主要来自环境颗粒;无清晰轮廓且体积较大的 Zara主要为摩擦取向失效形成的岛状漏光。为降低Zara不良进行实验，结果显示：增加取向膜在基板上的覆盖率以及变更彩膜涂层材料可有效降低Zara不良的发生率;此外，减小柱状隔垫物的坡度角度能够从源头上有效防止Zara的产生。Zara不良的研究与改善提升了小尺寸FFS产品的良率5%以上，为企业的稳定高效生产奠定了基础。

By analyzing massive Zara samples, four theoretical modes were created to illustrate the relationship of the classified Phenomenon and appropriate cause, and on this basis, experiments were designed to reduce the zara defect. We found that the floating zara with the size of about 5 μm was mainly the chip caused by rubbing process; the irremovable zara with the size between 10 μm and 25 μm was mainly caused by alignment film coating; the large size zara with a clear outline was mainly environmental particle, while the large size zara with blurry outline was mainly domain leakage because of orientation failure. The experiments were designed to reduce the Zara defect and the result showed that after improving the alignment coverage and changing CF OC material, zara defect was obviously reduced. Furthermore diminished CF profile angle can effectively avoid Zara procreation at the source. The research and improvement of zara defect raised the product yield of more than 5%, laid the foundation for a stable and efficient production of enterprises.