为了解决红外探测器生产、科研和测试中对响应均匀性、一致性和成品率的要求，用可调制半导体激光器替代黑体辐射源，设计了一套红外探测器表面响应测试系统。该系统应用计算机技术控制二维扫描平台，完成探测器平面的响应数据采集，通过VB 调用MATLAB 三维图形输出技术，直观的反映出探测器表面的响应情况。该系统自动完成整个测试过程，测试精度达到了0.001 2 V，为探测器的自动化检测和科研提供了先进的方法和测试平台。

In order to meet the requirements of response uniformity and rate of finished products in infrared detector manufacturing, studying and testing, a new test system of response for infrared detector is designed based on semiconductor modulated laser, which replaces blackbody radiation source. This system controls two-dimension scan workbench through computer, which accomplishes the data acquisition of detector. And the system uses the technology of VB call MATLAB realizing graphic model output, which reflects the response of detector clearly. The test process is completed automatically and the test precision reaches 0.001 2 V. The system provides an advanced method and test platform for studying and testing infrared detector automatically.