分别采用Holtsmark,Neutral Point,Nearest-Neighbor和Mayer模型微场分布函数对Stark线型进行了研究,进而得到相应微场函数下的Stark加宽和频移,研究了4种不同的微场分布函数对Stark加宽和频移的影响。研究结果表明,在电子加宽参数不变时,4种微场分布函数对Stark加宽和频移的影响随离子加宽参数的增加而增加;在离子加宽参数不变时,4种微场分布函数对Stark加宽和频移的影响随电子加宽参数的增加而增加;特别是,当离子加宽参数较大时,Mayer模型微场分布函数对Stark加宽和频移的影响异常明显。这说明,微场分布函数对谱线的加宽和频移的影响在离子与离子碰撞剧烈的等离子体环境中尤其显著,在这样的等离子体环境中,进行等离子体诊断时,选择合适的微场分布函数非常重要。结果对等离子体诊断有一定参考价值。

The Stark broadening and Stark shift were described with different electric microfield distribution functions.These microfield distribution functions include Holtsmark, Neutral Point,Nearest-Neighbor and Mayer model microfield distribution function. The Stark profiles with four microfield distribution functions were studied and the Stark broadening and Stark shift were obtained from the Stark profiles to study the influence of different electric microfield distribution functions on Stark broadening and Stark shift.The results show that the influence of different electric microfield distribution functions on Stark broadening and Stark shift increases with the plasmaions impact parameter with the same electrons impact broadening parameter. With the increase in the plasma electrons impact parameter the influence of different electric microfield distribution functions increases with the same ion impact broadening parameter. Especially, the influence of Mayer model electric microfield distribution function is very distinct when the ion impact broadening parameter is larger. It is illuminated that the plasmaions intense impact has great influence on the spectral line profile. It is very important for the plasma diagnosis to select appropriate electric microfield distribution function. The results have important reference for the plasma diagnosis.