液晶与显示, 2009, 24 (6): 809, 网络出版: 2010-05-06
一种新的X-射线发光光谱测量装置的建立
New Spectrometric Instrument for X-Ray Luminescence Materials Observation
摘要
提出一种由X-射线发生器、光学光纤、荧光光谱仪组成的用于测定X-射线发光材料的新装置。该设备可以测定X-射线发光材料的荧光强度随着波长的变化曲线、荧光强度随着激发时间的变化曲线、余辉衰减随着时间的变化曲线以及余辉时间等。研究了X射线发光材料在不同时间段的光谱特征。
Abstract
A new instrument for X-ray luminescence spectrum was established in order to study properties of X-ray luminescence materials,which consists of X-ray generator, optical fiber and fluorescence spectrophotometer and can determine spectral distribution graph,time-change graph,afterglow decay curve. The results showed that both of stability and precision are fine and relative standard deviation(RSD)is less more than 2%. The instrument simplifies the process for determining X-ray luminescence materials.
任新光, 罗劲松. 一种新的X-射线发光光谱测量装置的建立[J]. 液晶与显示, 2009, 24(6): 809. REN Xin-guang, LUO Jin-shong. New Spectrometric Instrument for X-Ray Luminescence Materials Observation[J]. Chinese Journal of Liquid Crystals and Displays, 2009, 24(6): 809.