红外与毫米波学报, 2010, 29 (1): 15, 网络出版: 2010-07-21   

反射式太赫兹返波振荡器成像系统及其应用

TERAHERTZ WAVE REFLECTION IMAGING SYSTEM BASED ON BACKWARD WAVE OSCILLATOR AND ITS APPLICATION
作者单位
首都师范大学物理系 北京市太赫兹波谱与成像重点实验室太赫兹光电子学教育部重点实验室, 北京100048
摘要
实现了基于返波管源的太赫兹波反射式成像系统.这是一种新型的无损探伤成像方式.从样品表面或者基底反射回来的太赫兹波被焦热电探测器收集, 最后经过计算机处理成像.频率为0.7THz的成像系统被用来对一系列样品进行无损检测, 如硬币、徽章、模型飞机以及预埋了人工缺陷的工业样品.结果表明, 很多工业材料相对于太赫兹波都是透明的, 尤其是一些在航空航天技术中具有广泛应用价值的吸收微波的材料.
Abstract
A terahertz (THz) wave reflection imaging system based on backward wave oscillator (BWO) was presented. It is a new approach to non-destructive testing. The intensity information of the terahertz wave after being reflected from the sample surface or substrate was collected by a pyroelectric detector, and then imaged by computer. A number of samples which had potential imaging applications were tested by using 0.7 THz radiation, including coins, badges, a model air-plane and some industrial samples that contained pre-built defects. The experimental results reveal that THz radiation is highly transparent to many industrial materials, especially the “microwave-absorbing” material which is widely used in aero and space technologies.

葛新浩, 吕默, 钟华, 张存林. 反射式太赫兹返波振荡器成像系统及其应用[J]. 红外与毫米波学报, 2010, 29(1): 15. GE Xin-Hao, LV Mo, ZHONG Hua, ZHANG Cun-Lin. TERAHERTZ WAVE REFLECTION IMAGING SYSTEM BASED ON BACKWARD WAVE OSCILLATOR AND ITS APPLICATION[J]. Journal of Infrared and Millimeter Waves, 2010, 29(1): 15.

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