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532 nm激光对面阵和线阵CCD损伤效应实验研究

Experimental study on 532nm laser-induced failure of array and linear CCD

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摘要

为了研究面阵CCD和线阵CCD由结构差异所致激光损伤效应的区别,针对这两种类型CCD器件进行了机理分析和对比实验研究。分别测量出波长为532nm的激光对线阵CCD和面阵CCD图像传感器的光饱和串音阈值、所有像素串音阈值和硬损伤阈值。结果表明,面阵CCD的光饱和串音阈值和永久破坏阈值比线阵CCD低,而串音扩散到所有像素的阈值高于后者。反映出线阵CCD由于其1维结构更能抵抗激光的干扰和破坏,而面阵CCD在抵御饱和串音在像素间扩散上比线阵CCD有优势。

Abstract

The mechanism of damage on the linear CCD and array CCD was analyzed. Under the irradiation of 532nm laser, the crosstalk threshold, all-pixel crosstalk threshold and totally damaged threshold of both the types of CCDs were measured. Experimental results show that the crosstalk threshold and permanent damage threshold of array CCD are higher than those of linear CCD, while the all-pixel crosstalk threshold of array CCD is lower. This reflects the linear CCD is more resistant to laser interference and sabotage due to its one-dimension structure, while the array CCD is better at resisting the spread of crosstalk between pixels.

Newport宣传-MKS新实验室计划
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中图分类号:TN977

收稿日期:2009-09-18

修改稿日期:2009-10-23

网络出版日期:0001-01-01

作者单位    点击查看

廖海:四川大学 电子信息学院, 成都 610064
孙年春:四川大学 电子信息学院, 成都 610064
冯国英:四川大学 电子信息学院, 成都 610064
周传明:中国工程物理研究院 科技委, 绵阳 621900

联系人作者:孙年春(8178137@163.com)

备注:廖海(1985-),男,硕士研究生,现主要从事光与物质相互作用的研究。

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引用该论文

LIAO Hai,SUN Nian-chun,FENG Guo-ying,ZHOU Chuan-ming. Experimental study on 532nm laser-induced failure of array and linear CCD[J]. Laser Technology, 2010, 34(5): 643-646

廖海,孙年春,冯国英,周传明. 532 nm激光对面阵和线阵CCD损伤效应实验研究[J]. 激光技术, 2010, 34(5): 643-646

被引情况

【1】康文运,危峻,宋小全,王禹. 激光对推扫相机的干扰. 红外与毫米波学报, 2014, 33(6): 608-612

【2】张超,张伟,王滨,万勇,薛亮平,李燕凌. 不同波长激光对CCD的干扰性实验研究. 激光技术, 2014, 38(6): 826-829

【3】李晓龙,赵威,张雷雷,张启鹏,康华超,刘伟. 1.06μm脉冲激光对TDI-CCD的干扰实验研究. 激光技术, 2015, 39(3): 416-418

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