分析了光电探测器偏振响应产生的原因，定义了探测器偏振敏感度的公式，制备了测试用InGaAs探测器。为了测试器件的偏振敏感度，搭建了测试系统，并对器件的偏振敏感特性进行了测试。结果表明，测试系统具有较好的稳定性；器件响应存在明显的偏振特性，正入射时器件的偏振敏感响应为0.27 dB，斜入射时器件偏振敏感有所增加，入射角度为10°时达到0.41 dB。

Response characteristic of photodetector, which is caused by polarization state of incident light, is analyzed. The calculation formula of polarization-dependent sensitivity is deduced, and an InGaAs detector is fabricated for the experimental test. In order to test the polarization-dependent sensitivity of photodetector, an experimental system is established, and the polarization-dependent sensitivity of the InGaAs detector is measured. The results indicate that the experimental system has a good stability and the polarization-dependent sensitivity of the InGaAs detector is 0.27 dB under normal incidence，while 0.41 dB under 10° oblique incidence.