现代显示, 2011, 22 (4): 36, 网络出版: 2011-04-08
关于TFT-LCD中Gate Pad腐蚀的分析及改善
Analysis and Improvement of Gate Pad Erosion on TFT-LCD
摘要
腐蚀问题一直是影响产品品质的一大罪魁,在TFT-LCD(thin film transistor-liquid crystal display)以及其它显示器件产品中,由于腐蚀造成的亮线、异常显示等不良严重影响到产品的使用效果。文章结合实际生产情况,对栅极Pad腐蚀多发不良进行了理论研究,并从设计、工艺等角度提出了多项解决方案。根据实验测试结果,腐蚀问题得到了很好的控制,不良比率降低80%以上,产品品质得到了有效的保证,并为相关领域实际生产及研究奠定了一定的理论基础。
Abstract
For TFT-LCD and other display products, erosion is a relatively common defect that degrades the display quality greatly, such as line defect, abnormal display, etc. Failure mechanism of gate pad erosion is researched theoretically according to the practical mass production. Based on design and process, several solutions are brought forward in the paper. The test result indicates that erosion is effectively prevented and an 80% reduction of defect ratio is achieved. The research provides a theoretical basis for practical production with regard to correlative industries.
路林林, 于洋, 徐帅. 关于TFT-LCD中Gate Pad腐蚀的分析及改善[J]. 现代显示, 2011, 22(4): 36. LU Lin-lin, YU Yang, XU Shuai. Analysis and Improvement of Gate Pad Erosion on TFT-LCD[J]. ADVANCED DISPLAY, 2011, 22(4): 36.