将白光偏振干涉和迈克耳孙干涉仪相结合，提出了一种利用空间白光干涉图测量波片延迟量（包括级次信息）的方法。白光偏振干涉系统产生两束振动方向相同的线偏光，进入迈克耳孙干涉仪后分别被两干涉臂的平面镜反射，并两两干涉，在空间形成3组白光干涉包络。当被测件为多级波片时，根据白光干涉包络之间的光程差就可求得被测延迟量；当被测件为低级次波片时，利用白光干涉信号相位的改变量计算出延迟量的值。实验分别测量了多级波片和零级全波片的延迟量，其结果与使用光谱扫描法测量得到的结果均相吻合。

A method using white-light Michelson interferometer and polarization interferometry system for measuring the retardation of wave plates (including the order of retardation) is presented. The linear polarized white-light passes through the test wave plate which introduces retardation between the o-beam and e-beam, and then they are divided by a beam splitter and reflected by two plane mirrors of the Michelson interferometer respectively. Finally three white-light interference packets are formed. For a multiple-order wave plate, the interference packets will be separated absolutely, and according to the optical path between the center packet and one of the side packets, the retardation of multiple-order wave plates can be obtained. The retardation of a lower-order wave plate and the stress of a optical glass can be calculated by using the phase variation after inserting it behind the multiple-order wave plate. The retardations of a multiple-order and zero-order wave plate are measured in experiments, whose results coincide with the ones obtained by spectroscopic method.