分析了金属化膜脉冲电容器的失效机理。根据金属化膜脉冲电容器加速退化数据，研究了其可靠性评价问题。基于疲劳失效的Birnbaum-Saunders模型，建立电容器失效分布函数。根据试验数据可求得该型电容器可靠性模型中参数估计值，并将该值代入失效分布函数即可确定电容器的失效模型，求得该型电容器充放电20 000次的可靠度为0.972 4。使用这种分析方式对金属化膜脉冲电容器进行可靠性分析将更能节省试验时间和费用。

The high energy density self-healing metallized film pulse capacitor has been applied to all kinds of laser facilities for their power conditioning systems, whose reliability is straightforward affected by the reliability level of capacitors. Reliability analysis of highly reliable devices, such as metallized film capacitors, is a challenge due to cost and time restriction. Accelerated degradation test provides a way to predict its life cost and time effectively. A model and analyses for accelerated degradation data of metallized film capacitors are described. Also described is a method for estimating the distribution of failure time. The estimation values of the unknown parameters in this model are 9.066 9×10－8 and 0.022 1. Both the failure probability density function (PDF) and the cumulative distribution function (CDF) can be presented by this degradation failure model. Based on these estimation values and the PDF/CDF, the reliability model of the metallized film capacitors is obtained. According to the reliability model, the probability of the capacitors surviving to 20 000 shot is 0.9724.