光学学报, 2011, 31 (10): 1016001, 网络出版: 2011-09-16  

衬底温度对非极性ZnO薄膜结晶性能和发光特性的影响

Effect of Substrate Temperature on Crystallization and Luminescence Properties of Nonpolar ZnO Films
作者单位
1 中国科学院上海光学精密机械研究所中科院强激光材料重点实验室, 上海 201800
2 中国科学院研究生院, 北京 100049
3 中国科学院苏州纳米技术与纳米仿生研究所, 江苏 苏州 215123
摘要
采用金属有机化学汽相沉积(MOCVD)设备在LiGaO2(100)衬底上制备了结晶性能良好的非极性ZnO薄膜。研究了衬底温度对ZnO薄膜结晶性能的影响。X射线衍射(XRD)分析结果表明在衬底温度为500 ℃时可以获得高质量的(1100)晶面取向的非极性ZnO薄膜。采用原子力显微镜(AFM)观察ZnO薄膜的表面形貌及晶体尺寸,观察到500 ℃生长的ZnO薄膜表面更加平整,晶粒分布均匀,粗糙度均方根值(RMS)为0.626 nm。光致发光(PL)光谱结果显示,ZnO薄膜的带边发光峰均位于375 nm,但是在较低温度下(400 ℃)生长时黄光峰较强,说明低温生长时结晶性能较差,且缺陷较多。
Abstract
Nonpolar ZnO films of high crystallization have been prepared by metal organic chemical vapor phase deposition on LiGaO2 (100) substrates. Effect of substrate temperature on the crystallization of ZnO films is investigated. X-ray diffraction (XRD) results indicated that high quality nonpolar ZnO films are obtained at 500 ℃. The surface morphologic image and crystal size are observed by atomic force microscope (AFM). The ZnO film deposited at 500 ℃ shows a smoother and uniform morphologic image, the root mean square (RMS) value roughness is 0.626 nm. According to the photoluminoscence (PL) spectra, the near band emission peaks of the ZnO films are located at 375 nm. However, the yellow emission is stronger when the film is deposited at 400 ℃, inferring that the crystallization property of ZnO film is poor at lower temperature, and there are more defects in the film.

贾婷婷, 周圣明, 林辉, 滕浩, 侯肖瑞, 王建峰, 徐科. 衬底温度对非极性ZnO薄膜结晶性能和发光特性的影响[J]. 光学学报, 2011, 31(10): 1016001. Jia Tingting, Zhou Shengming, Lin Hui, Teng Hao, Hou Xiaorui, Wang Jianfeng, Xu Ke. Effect of Substrate Temperature on Crystallization and Luminescence Properties of Nonpolar ZnO Films[J]. Acta Optica Sinica, 2011, 31(10): 1016001.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!