光电工程, 2012, 39 (3): 52, 网络出版: 2012-04-01   

CMOS 摄像模组缺陷的自动检测系统研究

An Automatic Optical Detecting System for Inspection of CMOS Compact Camera Module
作者单位
南阳理工学院 电子与电气工程系,河南 南阳 473004
摘要
CMOS 摄像模组缺陷检测要求系统能够检测光学镜头聚焦状况以及在摄像模组生产过程中产生的各种缺陷,包括:亮点、暗点、线缺陷、色差和暗斑等。为实现检测目的,系统使用CPLD 通过帧捕捉把图像传输至计算机进行处理,运用多种图像处理算法来分析获取的不同图像,以检测出模组的相应缺陷。实验结果证明该系统在生产线上能够可靠运行,实现高速度高精度的缺陷检测。
Abstract
Defect inspections of Compact Camera Module (CCM) are made mainly by human inspectors. For improving the efficiency and precision, it’s very necessary to develop an automatic inspection system for CCM. It can check lens focus status and inspect defects including white defect, black defect, line defect, color defect, and dim defect in manufacturing process. It has a complex programmable logic device, and the camera link and the frame grabber are used to transfer and store images to PC. Various image processing algorithms are developed to analyze the captured image from each test chart and to find and verify the defects of camera modules. The experimental results show that the proposed system is able to reliably inspect various types of defects with high precision and high speed in real manufacturing condition.

张戈, 李定珍. CMOS 摄像模组缺陷的自动检测系统研究[J]. 光电工程, 2012, 39(3): 52. ZHANG Ge, LI Ding-zhen. An Automatic Optical Detecting System for Inspection of CMOS Compact Camera Module[J]. Opto-Electronic Engineering, 2012, 39(3): 52.

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