强激光与粒子束, 2012, 24 (2): 357, 网络出版: 2012-05-08
Z箍缩等离子体均匀色散晶体光谱成像
Z-pinch plasma spectral imaging with uniform dispersion crystal
Z箍缩等离子体 弯晶谱仪 均匀色散 晶体分析器 X射线诊断 Z-pinch plasma bent crystal uniform dispersion crystal analyzer X-ray diagnosis
摘要
为了诊断Z箍缩等离子体X射线相关信息,利用自聚焦和均匀色散原理,研制了一种新型的均匀色散弯晶谱仪。晶体分析器采用α-石英(1010),布拉格角为43.4°~72.7°,利用有效面积为10 mm×50 mm的X射线胶片接收光谱信号,实验在中国工程物理研究院阳加速器装置上进行,摄谱元件获得了Z箍缩铝丝阵等离子体的类H及类He谱线。实验结果表明:谱线分布遵循均匀色散条件,所研制均匀色散弯晶谱仪线色散率为-116.198 mm/nm,与理论值-120 mm/nm的相对误差为3.168%,能够用于Z箍缩等离子体X射线的光谱学研究。
Abstract
Based on the self-focusing and uniform dispersion principle, a spectrograph with uniform dispersion bent crystal was developed for Z-pinch plasma X-ray diagnosis. α-quartz (1010) crystal was used as dispersion element and the Bragg angle of the crystal analyzer ranged from 43.4° to 72.7°. The X-ray film was employed to receive the spectra with an effective area of 10 mm×50 mm. The experiment was carried out at the Yang accelerator in China Academy of Engineering Physics. The H-like and He-like spectra of aluminum Z-pinch plasma were obtained. The distribution of aluminum spectra satisfies the uniform dispersion condition. The linear dispersion of the developed spectrograph is -116.198 mm/nm and the error is only 3.168% relative to the theoretical value of -120 mm/nm. The experimental results demonstrate that the uniform dispersion bent crystal spectrograph is suitable for Z-pinch plasma X-ray spectroscopy diagnosis.
鲁建, 阳庆国, 肖沙里, 黄显宾, 蔡红春. Z箍缩等离子体均匀色散晶体光谱成像[J]. 强激光与粒子束, 2012, 24(2): 357. Lu Jian, Yang Qingguo, Xiao Shali, Huang Xianbin, Cai Hongchun. Z-pinch plasma spectral imaging with uniform dispersion crystal[J]. High Power Laser and Particle Beams, 2012, 24(2): 357.