为满足高能X射线能谱测量的需要，提出采用MLS法进行能谱测量的方案。MLS法克服了其他测量方法散射不易控制、光场不均匀性影响较大的缺点，还具有对不同角度能谱进行测量的优势。对MLS法的测量原理以及测量过程中的注意事项进行了明确，并利用蒙特卡罗方法针对一特定的X射线能谱设计了两种不同介质的测量装置，并将测量装置自身散射的影响控制在5%以内。

The paper proposes an MLS(multi-layer stacking) method to measure the high-energy X-ray energy spectrum．The MLS method has some unique merits: scattering is more easier to control during the measurement; the uniformity of the light field can be more effectively guaranteed; and measurement from different points of view can be realized. The principle of the MLS method is introduced as well as precautions during measurement. For a given X-ray energy spectrum, measuring devices using two different measuring media are designed with Monte Carlo method, and the scattering influence brought about by the devices can be controlled within 5%.