主动像元型(APS)互补金属氧化物半导体(CMOS)图像传感器的成像性能已经接近电荷耦合器件(CCD)的成像性能，在光谱成像领域有很好的应用前景。讨论了CMOS器件用于光谱探测的若干问题，建立了光谱成像系统的噪声模型并进行了实际噪声测试，分析了基于CMOS探测器的成像光谱仪的灵敏度水平；结合CMOS器件的结构和特性给出了图像的校正方法。搭建了包括光学、电子学的完整光谱成像系统，进行了光谱成像试验，验证了灵敏度分析和光谱校正方法。结果表明，CMOS探测器可以满足高光谱成像的灵敏度要求，可用于高光谱探测。

Active pixel sensor (APS) complementary metal-oxide-semiconductor (CMOS) sensors have performances competitive with charge coupled device (CCD). A number of potential advantages bring it a good prospect of application hyper-spectral imagery area. Several issues about applications of CMOS sensor for imaging spectrometers are discussed. Noise model is built and sensitivity performance of hyper-spectral imagers using CMOS sensors is analyzed. Spectral image calibration method is proposed based on the structure and features of CMOS detectors. Spectral imaging system including electronics and optics is formed, and analyses are proved by imaging experiment. Results show that CMOS sensors can meet the sensitivity requirement of hyper-spectral imagers and are available for hyper-spectral applications.