半导体光电, 2012, 33 (4): 596, 网络出版: 2012-09-04
双目光电装备光轴平行性数字化检校系统设计
Digital Calibration System of Binocular Photoelectric Equipment Optical Axis Parallelism
双目光电装备 多光谱 光轴 数字化 图像处理 binocular photoelectric equipment multispectrum optical axis CCD CCD digitized image processing
摘要
设计了一种多光谱双目光电装备光轴平行性数字化检校系统。利用平行光管产生无限远白光、微光、红外目标, 平行光经双目光电装备、光轴平移装置, 将两路光线入射到面阵CCD上, 目标图像经CCD、图像采集卡转换成数字图像信息送入计算机, 利用软件算法得到光轴误差量, 参考所建立的光电装备数学模型, 给出光轴校正方案, 利用辅助工具完成光轴平行性校正。该系统适用于多种双目光电装备, 能够实现自动化检测, 并给出数字化的光轴误差量, 具有良好的通用性和可扩展性。
Abstract
For the calibration system, a collimator is used to give white target, dim light target or IR target at infinity. Through the binocular photoelectric equipment and optical axis translation device, the two parallel lights will be incident to the area array CCD, and the target images are converted into digital image information by the CCD and frame grabber, which will be put into the computer, with which the optical axis deviation can be calculated. Then by referring to the mathematical model, the computer can give the optical axis correction program and assist in completing the parallel correction. The system is suitable for a variety of optoelectronic equipments; it can realize auto detection and display the optical axis deviation in digital form, obtaining good versatility and expansibility.
史云胜, 刘秉琦, 应家驹, 姜玉海. 双目光电装备光轴平行性数字化检校系统设计[J]. 半导体光电, 2012, 33(4): 596. SHI Yunsheng, LIU Bingqi, YING Jiaju, JIANG Yuhai. Digital Calibration System of Binocular Photoelectric Equipment Optical Axis Parallelism[J]. Semiconductor Optoelectronics, 2012, 33(4): 596.