光学学报, 2003, 23 (s1): 331, 网络出版: 2013-01-28
A Novel Technique to Measure Gain Spectrum for Fabry-Perot Semiconductor Lasers
A Novel Technique to Measure Gain Spectrum for Fabry-Perot Semiconductor Lasers
摘要
Abstract
A novel gain measurement technique based on the integration of the measured amplified spontaneous emission spectrum multiplying a phase function over one longitudinal mode interval is proposed for Fabry-Perot semiconductor lasers.
Wei-Hua Guo, Qiao-Yin Lu, Yong-Zhen Huang, Chun-Lin Han, Li-Juan Yu. A Novel Technique to Measure Gain Spectrum for Fabry-Perot Semiconductor Lasers[J]. 光学学报, 2003, 23(s1): 331. Wei-Hua Guo, Qiao-Yin Lu, Yong-Zhen Huang, Chun-Lin Han, Li-Juan Yu. A Novel Technique to Measure Gain Spectrum for Fabry-Perot Semiconductor Lasers[J]. Acta Optica Sinica, 2003, 23(s1): 331.
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