作为一门新兴的无损检测技术，红外故障诊断技术近几年得到了飞速发展。与传统的故障诊断相比， 红外故障诊断具有非接触、灵敏度高等一系列优点，所以它在故障诊断中的应用日益广泛。对于缺陷故障的定量检测问题， 人们已提出了各种方法，建立了待测缺陷大小与其在红外热图像中亮度高低关系的理论模型。每种方法都有缺点及局限性。 对于不同缺陷的定量检测，至今仍没有一个通用的理论模型。

As an emerging non-destructive detection technology, infrared fault diagnosis is developed rapidly in recent years. Compared with the traditional methods, infrared fault diagnosis has a series of advantages such as noncontact and high sensitivity. It is being widely used in the field of fault diagnosis. For the quantitative detection of defects, people has proposed many different methods and established the theoretical model for determining the relation of the defect size to its brightness in infrared thermal images. Each method has its shortcomings and limitation. There is still no a common theoretical model for the quantitative detection of different defects so far.