为了更好了解液相隔膜辉光放电等离子体引发的化学反应机理, 运用发射光谱法研究了稀硫酸溶液隔膜辉光放电等离子体产生的自由基, 估算了电子温度与电子密度。 结果表明: 当电压超过700 V时, 观察到了羟基自由基和氢原子的发射光谱; 当电压超过750 V时, 除了羟基自由基和氢原子外, 还观察到了氧原子的发射光谱; 这些自由基的发射强度随电压升高而升高; 稀硫酸溶液隔膜辉光放电等离子体的平均电子温度与平均电子密度分别为1.3×104 K与7.8×1017 cm-3。

In order to probe the aqueous reaction mechanism of liquid-phase diaphragm glow discharge (LDGD), radicals formed during the discharge were analyzed by their emission spectra. Emissions of H atoms and OH radicals were observed when the applied voltage was above 700 V. When the applied voltage increased to 750 V, emissions of O atoms were additionally detected. The emission intensities of these radicals and atoms increased with increasing applied voltage. The average electron temperature and the mean electron density of the LDGD plasma were 1.3×104 K and 7.8×1017 cm-3, respectively.