为研究画面闪烁与光照漏电流(Ioff-p)的关系, 文章进行了一系列的实验。首先利用色彩分析仪(CA310)分别测试了3张面板正、反两面的闪烁。其次通过测量闪烁随背光源亮度的变化研究了其与光照的关系。同时还采用光敏放大器测试了面板正、反两面闪烁画面下的亮度信号, 并给出了原理性解释。最后采用半导体参数设备对TFT进行了I-V特性测试。所有的实验结果均表明, Ioff-p过大能够导致像素电压无法有效保持, 从而使正负帧的亮度产生较大差异, 最后造成闪烁偏高。

In order to study relationship between Flicker and Ioff-p in TFT-LCD, a large amount work had been made. Flicker of obverse and reverse of 3 panels were observed by CA310. The relationship between Flicker and BLU brightness were researched. Brightness of obverse and reverse of 3 panels were also researched by photo sensor amplifier in Flicker pattern. I-V curve was measured by semiconductor parameter equipment. All results show that Ioff-p was too large to pixel voltage couldn′t hold, then brightness of odd frame and even frame was different, and Flicker became serious.