红外技术, 2013, 35 (10): 629, 网络出版: 2013-11-01
背减薄工艺对中波320×256碲镉汞红外焦平面探测器组件可靠性的影响
Back-thining on Reliability Influence for MW 320×256 MCT IRFPA
摘要
通过对 A版(初减薄)和 B版(终减薄)中波 320×256碲镉汞红外焦平面探测器组件进行可靠性试验, 并对其试验后的光电特性进行比较, 最终给出 B版焦平面探测器组件工作寿命的初步评价。
Abstract
The article devises and accomplishes the reliability experiment for A type(preliminary back-thining)and B type(ultimate back-thining)of MW 320×256MCT IRFPA. The photoelectric characteristic of A type and B type is compared after experiment. The preliminary assessment is done for B type on work life.
田立萍, 朱颖峰, 刘湘云, 郭建华. 背减薄工艺对中波320×256碲镉汞红外焦平面探测器组件可靠性的影响[J]. 红外技术, 2013, 35(10): 629. TIAN Li-ping, ZHU Ying-feng, LIU Xiang-yun, GUO Jian-hua. Back-thining on Reliability Influence for MW 320×256 MCT IRFPA[J]. Infrared Technology, 2013, 35(10): 629.
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