Photonics Research, 2019, 7 (7): 07000B36, Published Online: Jun. 21, 2019   

Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes

Author Affiliations
1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
2 Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstr. 36, EW 6-1, 10623 Berlin, Germany
Abstract
The impact of operation current on the degradation behavior of 310 nm UV LEDs is investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current densities from 34 to 201 A/cm2. To separate the impact of current from that of temperature, the junction temperature is kept constant by adjusting the heat sink temperature. Higher current was found to strongly accelerate the optical power reduction during operation. A mathematical model for lifetime prediction is introduced. It indicates that lifetime is inversely proportional to the cube of the current density, suggesting the involvement of Auger recombination.

Jan Ruschel, Johannes Glaab, Batoul Beidoun, Neysha Lobo Ploch, Jens Rass, Tim Kolbe, Arne Knauer, Markus Weyers, Sven Einfeldt, Michael Kneissl. Current-induced degradation and lifetime prediction of 310  nm ultraviolet light-emitting diodes[J]. Photonics Research, 2019, 7(7): 07000B36.

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