半导体光电, 2014, 35 (2): 230, 网络出版: 2014-04-28
晶体管输出型光电耦合器长期储存寿命研究
Research on Storage Life of Transistor Output Optocouplers
摘要
介绍了两种长期储存寿命的考核方法, 通过对晶体管输出型光电耦合器进行加速寿命试验, 记录数据并进行统计分析, 利用寿命模型推算出了晶体管输出型光电耦合器常温下的储存寿命。
Abstract
Two methods of assessing the long-term storage life were introduced, and also accelerated life tests were performed on transistor output optocouplers. Statistical data and life model can be used to calculate the storage life of the optocouplers under room temperature.
李洪玉, 金雷, 陈春霞, 欧熠, 张佳宁, 谢俊聃, 成精折. 晶体管输出型光电耦合器长期储存寿命研究[J]. 半导体光电, 2014, 35(2): 230. LI Hongyu, JIN Lei, CHEN Chunxia, OU Yi, ZHANG Jianing, XIE Jundan, CHENG Jingzhe. Research on Storage Life of Transistor Output Optocouplers[J]. Semiconductor Optoelectronics, 2014, 35(2): 230.
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