光学与光电技术, 2014, 12 (2): 19, 网络出版: 2014-05-04
红外探测器的高频测试
High-Frequency Test of Infrared Detector
摘要
研究了长波8~15 μm波段,阻值大于440 Ω MCT光导红外探测器,探测率在10 kHz,14 μm大于4×1010 cm·Hz1/2/W,在1 kHz和10 kHz中心频率下的噪声测试,中波5~8 μm红外光伏型InSb器件,探测率在25 kHz,8.26 μm大于1×1011 cm·Hz1/2/W,在1 kHz和255 kHz中心频率下的噪声测试,并对器件信号进行了测试。信号和噪声测试是在124A锁相放大器测试系统测试,对124A测试系统的不确定度进行了分析,并与动态信号分析仪35670A对器件在0~50 kHz频谱范围的噪声进行了测试和比较。实验结果表明,高阻值的光导器件在1 kHz和10 kHz中心频率下噪声相差约1.4倍,光伏型InSb器件在1 kHz和15 kHz中心频率下噪声相差约1.5倍,信号测试结果在1 kHz下和3 kHz中心频率下变化不超过3%。通过测试和比较,对高频下的测试给出了建议。
Abstract
The photo conductive detector in 8-15 μm band, resistance quality greater-than-equal match 440 Ω, detectivity(10 kHz,14 μm) greater-than-equal match 4×1010 cm·Hz1/2/W, whose noise test in 1 kHz and 10 kHz frequency of center of lock-in 124A amplifier is studied in this paper. InSb photovoltaic detector in media wave of 5~8 μm, detectivity(25 kHz, 8.26 μm) greater-than-equal match 1×1011 cm·Hz1/2/W, whose noise in 1 kHz and 25 kHz frequency of center of lock-in 124A amplifier is tested. The signal of detector and noise are also tested in 1 kHz,2 kHz,3 kHz center frequency of lock-in 124A amplifier, system test inaccuracy of 124A is analyized. The noise test result of 124A is compared with 35670A dynamic signal analyzer test result. The test results approve that the noise in 1 kHz is 1.5 mutiple in 10 kHz of photo conductive detector, 1.5 multiple in 15 kHz of photovoltaic detector. The signal test result in 1 kHz and 3 kHz center frequency of 124A vary less than 3 percentage. Finally this paper gives advise to high frequency test through analysis of test dada.
张亚妮, 汪洋, 贺香荣, 莫德峰, 王妮丽. 红外探测器的高频测试[J]. 光学与光电技术, 2014, 12(2): 19. ZHANG Ya-ni, WANG Yang, HE Xiang-rong, MO De-feng, WANG Ni-li. High-Frequency Test of Infrared Detector[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2014, 12(2): 19.