光电技术应用, 2014, 29 (2): 43, 网络出版: 2014-06-03  

基于时序逻辑的测试系统的设计与实现

Design and Implementation of Testing System Based on Logic Time Sequence
作者单位
湖北三江航天红林探控公司第三研究室, 湖北 孝感 432000
摘要
为对某系统工作状态中的重要性能参数进行全程监测和定量分析, 并满足在高冲击等特殊环境下使用的要求, 提出了一种基于FPGA以及Flash介质的测试存储系统设计方案。详细阐述了硬件系统各组成模块的电路及其工作原理, 给出了系统内部数字电路的时序逻辑, 介绍了采集中的编码方法和提高存储速度的方法。在实际工作过程中, 测试系统达到了准确、可靠的记录技术要求, 记录下的数据为器件的工作状态分析提供了详实的依据。
Abstract
In order to monitor and analyze quantitatively the important performance parameters of a system in operation during full process and satisfy the operation requirements under special operation environments such as high pressure impact, a measurement and storage system design method is proposed based on field-programmable gate array (FPGA) and Flash dielectric. The circuits and operation principles of the modules in hardware system are described in detail. The corresponding timing sequence logic of digital circuits in the system is given. The methods for encoding in collection and for improving storage speed are introduced. The accurate and reliable design requirements in operation are achieved. And detailed basis is provided for analyzing the operation states of the device based on the recorded data.

王华乔, 王明忠, 王会鹏. 基于时序逻辑的测试系统的设计与实现[J]. 光电技术应用, 2014, 29(2): 43. WANG Hua-qiao, WANG Ming-zhong, WANG Hui-peng. Design and Implementation of Testing System Based on Logic Time Sequence[J]. Electro-Optic Technology Application, 2014, 29(2): 43.

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