提出了把液晶波片作为电控补偿器，使用偏光显微镜的白光照射条件下测试液晶器件光程差二维分布的方法，建立了液晶器件在正交偏光下测试二维光程差分布的验证系统。使用该系统测试了液晶电控波片的光程差分布，将测试数据与传统的1/4波片法的测试结果进行了标定，误差在3%以内。在此基础上，使用上述系统完成了液晶光楔、紫外光寻址的透过式液晶空间光调制器二维光程差分布的测试，得到了二者的电控二维光程差分布规律。该方法的进一步优化，还可以用于液晶光学相控阵列的测试。研究意义在于，可以用偏光显微镜自带的白光照明系统来测试电控液晶器件在多个波长，包括近红外波段下光程差二维分布的显微结构，用于液晶光学相控阵列的驱动电压非线性校正、相位凹陷与回程区检测，还可用于液晶空间光调制器的光学寻址伽马校正等方面。

A approach that liquid crystal variable retrader (LCVR) is used as a compensator to test the 2-D distribution of optical path diffevence (OPD) of liquid crystal device under the condition of white light irradiation of polarizing microscope is proposed. The system used for testing and verifying 2-D distribution of OPD under the orthogonal polarization is set up. The OPD of LCVR is tested by using the system. The results tested by using this system and the Senamont are calibrated, the error is within 3%. On that basis, the 2-D distribution of OPD of liquid crystal light deflecter (DLD) and optical addressable-transimission space light modulater (OA-TSLM) are measured by using that system, and their regularities of distribution can also be obtained. It can be used to test the liquid crystal-optical phased array (LC-OPA), when the method is further optimized. Research significance lies in many aspects, such as, the 2-D distribution of OPD′ microstructure, which the electronic liquid crystal devicesare in multiple wavelengths and include near-infrared band can be used to test by this way with the system. The flyback,phase valley and nonlinear driving voltage, LC-OPA′ characteristics can be corrected and detected. It can also be used for optical addressable-space light modulator (OA-SLM) of gamma correction.