半导体激光器低频电噪声的大小受器件潜在缺陷的影响，与器件可靠性具有相关性。介绍了半导体激光器噪声测试及参数提取的原理，设计了基于超低噪声前置放大器和低频频谱分析仪的低频电噪声测试系统，可测量半导体激光器的低频电噪声并提取相关噪声参数，进而通过低频电噪声的研究对半导体激光器进行可靠性评价，具有灵敏度高、非破坏性等优点。

Low-frequency noise of semiconductor lasers is affected by latent defects of the devices, and have great relationship with the devices' reliability. This paper introduced the principle of low-frequency noise measurement and parameters extraction for semiconductor lasers, and designed a low-frequency noise measurement system based on ultra-low-noise preamplifier and low-frequency spectrum analyzer to measure low-frequency electrical noise of semiconductor lasers and extract the relevant parameters. And through research on the low-frequency electrical noise, reliability of semiconductor lasers could be evaluated with high sensitivity, non-destructive and so on.