光学学报, 2015, 35 (2): 0230002, 网络出版: 2015-01-20
X射线束斑强度分布对EDXRF分析精度影响研究
Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision
光谱学 射线强度 工作电流 准直器 杂散射线 射线光学 spectroscopy ray intensity working current collimator mixed and scattered ray radial optics
摘要
能量色散X射线荧光(EDXRF)光谱法分析复杂背景样品中的低含量元素时,X 射线散射产生的干扰会影响系统检测精度,而X 射线散射与X 射线束斑强度密切相关。利用微光像增强器采集了不同工作电流下X 射线束斑的投影图像,用投影光斑外围杂散射线强度表征X 射线散射强度,分析得到了减小X 射线束斑强度的两种方式,即降低X 射线管工作电流和减小准直器孔径。通过实验对比发现,利用EDXRF 法分析样品中低组分元素时,用减小准直器孔径的方法来降低X 射线散射,要比降低X 射线管电流的方式更加有效,且减小准直器孔径的同时增大X 射线管工作电流能够提高系统检测精度。实验结果表明,该方法检测土壤中微量元素Cr 时,实际相对误差为0.9%~6.6%,相对标准偏差为0.7%~1.5%,经过t 检验,p>0.05,测试结果在统计学上与标准样品结果无显著差异。
Abstract
When energy dispersive X-ray fluorescence (EDXRF) spectroscopy is used to analyze low-content element in samples with complicated background, interference from X-ray scattering will affect system detection precision, and X-ray scattering is closely related to X-ray beam spot intensity. A shimmer image intensifier is utilized to collect projection image of X-ray beam spot under different working current and the intensity of mixed and scattered ray around the projection flare is used to characterize X-ray scattering intensity, two methods to reduce X-ray beam spot intensity, i.e. reducing X-ray tube current and collimator diameter, are obtained so as to reduce the impact of the mixed and scattered ray on X-ray. It is found that when the EDXRF method is used to analyze low-content element in samples, the method of reducing collimator diameter is more effective than the method of reducing X-ray tube current for decrease of X-ray scattering, and the system detection precision can be improved when the collimator diameter is reduced and the X-ray tube current is increased meanwhile. The experimental results show that for detecting microelement Cr in the soil, actual relative error of this method is 0.9%~6.6%, and relative standard deviation is 0.7%~1.5%. p is higher than 0.05 in t test, and the test result has no significant difference with standard samples statistically.
秦旭磊, 端木庆铎, 宋忠华, 李野, 李珅, 刘有银, 王国政. X射线束斑强度分布对EDXRF分析精度影响研究[J]. 光学学报, 2015, 35(2): 0230002. Qin Xulei, Duanmu Qingduo, Song Zhonghua, Li Ye, Li Shen, Liu Youyin, Wang Guozheng. Study on Influence of X-Ray Beam Spot Intensity on EDXRF Analytical Precision[J]. Acta Optica Sinica, 2015, 35(2): 0230002.