激光与光电子学进展, 2015, 52 (7): 070601, 网络出版: 2015-07-06   

激光复合AFM探针捕获纳米微粒的作用力分析

Analysis of Force to Capture Nanoparticles by Composite Laser AFM probe
作者单位
1 哈尔滨商业大学轻工学院, 黑龙江 哈尔滨 150028
2 哈尔滨工业大学机电工程学院, 黑龙江 哈尔滨 150001
摘要
基于纳米尺寸材料的微操作提出了一种局域增强隐失场理论,其中的隐失场产生于光纤探针与原子力显微镜(AFM)探针耦合作用。根据近场光学原理,采用傅里叶变换方法推导出隐失场产生的机理,并讨论影响其强弱的因素。为了得到足够大的捕获纳米级微粒的力,通过采用复合光纤探针与AFM 探针,根据金属表面等离子体共振原理,使传播波和隐失波会聚于AFM 锥形探针针尖处形成增强的电磁波。对纳米级物体的捕获、移动等操作表明提出的理论可以用于微观科学的前沿领域。
Abstract
Based on micro operations on nanoscale materials, a locally enhanced evanescent field theory is proposed, in which the evanescent field is produced from coupling of optical fiber probe and atomic force microscope (AFM) probe. According to the principle of near-field optics, the Fourier transform is used to deduce the evanescent field generation mechanism, and the factors affecting its strength are dicussed. In order to get the force strong enough to capture the nanoscale objects, based on the metal surface plasma resonance principle, composite optical fiber probe and AFM probe solution is used to make the propagated wave and evanescent wave converge at the conical AFM probe tip and form enhanced electromagnetic wave. The operations such as capture of nanoscale objects and movement indicate that the theory can be used in the field of microcosmic science frontier.

马丽心, 郑纯, 李丹婷, 杨立军. 激光复合AFM探针捕获纳米微粒的作用力分析[J]. 激光与光电子学进展, 2015, 52(7): 070601. Ma Lixin, Zheng Chun, Li Danting, Yang Lijun. Analysis of Force to Capture Nanoparticles by Composite Laser AFM probe[J]. Laser & Optoelectronics Progress, 2015, 52(7): 070601.

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