为进一步研究激光对光电探测器的干扰及损伤,利用10.6 μm连续CO2激光辐照多晶硅光电探测器,进行了干扰与损伤阈值实验研究,得到了对多晶硅探测器的饱和干扰、损伤干扰阈值分别为5.55×10-4 W/cm2、0.48 W/cm2;分析了不同干扰功率、不同干扰时间的干扰效果,依据探测器受干扰程度提出了将干扰等级划分为点饱和、中度饱和、重度饱和与点损伤4个等级;通过干扰激光功率与干扰光斑面积的变化关系,得到两者按幂函数y=76.3×x0.29关系变化,并依据该变化关系探讨了10.6 μm脉冲激光对红外成像系统的干扰效果.

In our experiment,polycrystalline silicon detector was irradiated by 10.6 μm continuous-wave(CW)CO2 laser,and the saturated threshold and damage thresholds were determined,the achieved saturation threshold and damage threshold were 5.55×10-4 W/cm2 and 0.48 W/cm2,respectively.The jamming effectiveness and damage mechanism on polycrystalline silicon detector of different laser power densities and different laser irradiation time were analyzed,and according to the jamming degree of detector,the interference hierarchy was classified as 4 grades,such as point saturation,moderate saturation,severe saturation and point damage .Additional,based on the relationship between the interference laser power and the interference light spot area,the relational expression of power function y=76.3×x0.29 was got,and finally according to this,the jamming effect of 10.6 μm pulse laser on infrared imaging system was discussed.