基于PIN限幅器的电路与器件物理混合模式（Mixed-Mode）模型，考虑大功率微波作用下器件的高温强电场多物理过程，模拟分析了频率及重频等微波脉冲参数对限幅器热损伤过程的影响，数值模拟结果表明，不同频率的微波脉冲损伤PIN限幅器存在“拐点”频率，“拐点”频率的微波脉冲附近需要更多的能量（脉宽）损伤器件；重频脉冲前一个脉冲作用后，器件峰值温度近似负指数关系快速下降，器件处于高温时更容易损伤，热积累效应使重频脉冲较单个脉冲更容易毁伤器件。

Based on the PIN limiter circuit /device physics mixed mode model, considering the high electric field and high temperature devices multi-physical features under high-power microwave, we simulate the influence of frequency and microwave pulse repetition rate on thermal damage process of PIN limiter. Numerical simulation results show that different frequency microwave pulses damaging the PIN limiter exist a “turning point” frequency. Microwave pulses near the “turning point” frequency require more energy or pulse width to damage the device. After one pulse function on the device, the peak temperature of the device declines fast and it is similar to negative exponent relationship. It is easier when the device is in a high temperature. Heat accumulation effect makes it easier on damaging PIN limiter than the single pulse microwave.