Chinese Optics Letters, 2015, 13 (12): 121201, Published Online: Sep. 12, 2018
Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser
120.0120 Instrumentation, measurement, and metrology 120.4820 Optical systems 180.1790 Confocal microscopy 180.5810 Scanning microscopy
Abstract
A new optical method based on frequency-shift feedback and laser confocal microscopy is presented to noninvasively measure a microstructure inside a sample. Due to the limit of axial resolution caused by poor signal detection ability, conventional laser feedback cannot precisely measure the microstructure. In this Letter, the light scattered by the sample is frequency shifted before feedback to the laser to obtain a magnification. Weak signals that change with the microstructure can be detected. Together with the tomography ability of laser confocal microscopy, the inner microstructure can be measured with high axial resolution.
Weiping Wang, Yidong Tan, Shulian Zhang, Yan Li. Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO4 laser[J]. Chinese Optics Letters, 2015, 13(12): 121201.