红外与激光工程, 2015, 44 (1): 0027, 网络出版: 2016-01-26   

双波段比色精确测温技术

Dual waveband colori-metric temperature accurate measurement technology
作者单位
西安工程大学电子信息学院,陕西 西安 710048
摘要
非接触红外辐射测温具有响应速度快、准确、便捷等优势。为实现中低温(50~400 ℃)物体温度的精确测量,根据双波段比色测温原理,搭建了双波段比色测温试验系统。首先对试验系统所用的试验器件进行精确标定,得到拟合曲线,用多种插值算法对曲线进行校正。然后,用设定温度的面源黑体作为试验目标来进行试验温度数据采集。实验结果表明:搭建的双波段试验系统不需要知道目标发射率,也能较为精确地得到中低温物体的真实温度。当系统标定置信度为0.95时,物体的标准偏差在3 ℃以内。验证了搭建测温系统的正确性,实验装置的搭建对中低温物体真实温度的精确测量具有重要的研究意义。
Abstract
Non-contact infared radiation temperature measurement has the advantages such as fast response speed, accurate and convenient. In order to realize accurate measurement of the temperature of low-middle temperature objects(50-400 ℃), a system of dual waveband colori-metric temperature measurement based on the theory of dual waveband colori-metric temperature measurement was established. Firstly, the devices need to be calibrated accurately to fit curve which needs a variety of interpolation algorithm for correction. Then, the blackbody with given temperature′s was measured as a reference. Experimental results indicate that the system of dual waveband colori-metric temperature measurement can precisely obtain the true temperature of low-middle temperature objects without the presence of target launch rate. The standard deviation of the object is within 3 ℃ when the calibrated confidence is 0.95, which proves the validity of this experiment system. The construction of the experimental device for accurate measurement of low temperature object in the real temperature has important research significance.

李云红, 马蓉, 张恒, 曹浏, 霍可, 赵强. 双波段比色精确测温技术[J]. 红外与激光工程, 2015, 44(1): 0027. Li Yunhong, Ma Rong, Zhang Heng, Cao Liu, Huo Ke, Zhao Qiang. Dual waveband colori-metric temperature accurate measurement technology[J]. Infrared and Laser Engineering, 2015, 44(1): 0027.

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