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电-热应力对GaN基白光LED可靠性的影响

Effect of Current-temperature Stress on The Reliability of GaN LED

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摘要

研究了电流和温度应力因子及其共同作用时对GaN基白光LED可靠性的影响, 并从LED结构方面探究了各应力下LED的失效机理。结果表明, 以电流作为加速应力时, 荧光粉退化为其主要的失效方式, 同时LED出光的相关色温上升, 红色比减少; 在热应力下,主要是LED芯片结构发生变化, 峰值波长蓝移, 光通量衰减, 同时支架出现老化现象。电流和温度应力共同作用时, 温度应力对LED光通量的影响大于电流应力。电-热应力下的光通量衰减大于电、热应力单独作用时的衰减之和, 即电-热应力作用时, 光衰不具有线性叠加性。

Abstract

The effects of current-temperature stress on the reliability of LED were investigated, and the failure mechanism was analyzed from the structure of LED. It is found that the current and temperature have different influences on the reliability of LED. When LEDs are applied current accelerating stress, the degradation of phosphor is the main failure mode which can cause the increasing of correlated color temperature and decreasing of red ratio. When LEDs are applied temperature accelerating stress, the structure of chip would change, which leads to the blueshift of peak wavelength. In addition, the structure of housing also appears aging at high temperature. The temperature stress has greater effect on the reliability than current stress when the current stress and temperature stress are applied together. The attenuation of luminous flux under current-temperature stress is greater than the sum of current and temperature stress working alone, which namely implies that the current and temperature stress do not have the features of linear superposition.

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中图分类号:TN306

DOI:10.3788/fgxb20163701.0124

所属栏目:发光学应用及交叉前沿

基金项目:国家自然科学基金委-广东省联合基金重点项目(U1401249)资助

收稿日期:2015-10-08

修改稿日期:2015-11-03

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作者单位    点击查看

邹水平:华南理工大学 机械与汽车工程学院, 广东 广州510640
吴柏禧:华南理工大学 机械与汽车工程学院, 广东 广州510640
万珍平:华南理工大学 机械与汽车工程学院, 广东 广州510640
唐洪亮:华南理工大学 机械与汽车工程学院, 广东 广州510640
汤勇:华南理工大学 机械与汽车工程学院, 广东 广州510640

联系人作者:邹水平(1404345050@qq.com)

备注:邹水平(1991-), 男, 广东龙川人, 硕士研究生, 2014年于华南理工大学获得学士学位, 主要从事现代制造技术和LED的封装与可靠性方面的研究。

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引用该论文

ZOU Shui-ping,WU Bo-xi,WAN Zhen-ping,TANG Hong-liang,TANG Yong. Effect of Current-temperature Stress on The Reliability of GaN LED[J]. Chinese Journal of Luminescence, 2016, 37(1): 124-129

邹水平,吴柏禧,万珍平,唐洪亮,汤勇. 电-热应力对GaN基白光LED可靠性的影响[J]. 发光学报, 2016, 37(1): 124-129

被引情况

【1】刘梦玲,高艺霖,胡红坡,刘星童,吕家将,郑晨居,丁星火,周圣军. 插指型SiO2电流阻挡层对大功率LED外量子效率的影响. 发光学报, 2017, 38(6): 786-792

【2】李飙,任艺,常本康. 梯度掺杂结构GaN光电阴极的稳定性. 中国光学, 2018, 11(4): 677-683

【3】文尚胜,彭星,马丙戌,宋嘉良,符民,方方,胡捷频,康丽娟,孔令豹. 醇类物质对LED硅胶封装气密性的影响. 光子学报, 2018, 47(8): 823002--1

【4】宋嘉良,文尚胜,马丙戌,符 民,胡捷频,彭 星,方 方,廖少雄,康丽娟. GaN基白光LED可靠性研究与失效分析. 发光学报, 2018, 39(12): 1705-1713

【5】蓝栩砚,杨欣,宿世臣,章勇. 电流和温度应力对LED球泡灯可靠性的影响. 激光与光电子学进展, 2019, 56(8): 82301--1

【6】樊嘉杰,曹建武,刘 杰,经 周,孙 博,胡爱华. 近紫外LED封装器件的热稳定性及可靠性. 发光学报, 2019, 40(7): 871-878

【7】张槐洋,文尚胜,方 方,唐浩洲,林凯旋,邵沅玲,魏志权,康丽娟,廖少雄. 基于显微红外热点定位系统的发光二极管失效分析. 发光学报, 2019, 40(9): 1185-1191

【8】许丹丹,胡学功. 大功率LED透镜热学特性分析. 光学学报, 2019, 39(10): 1023001--1

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