利用传输矩阵法研究了含向列相液晶缺陷层的1维阶梯型双周期第4代准周期结构 缺陷模的电场方向调控特性。分析了外加电场方向和正入射波方向间夹角θ与缺陷模波长的位置、 品质因子、空间位置光场分布的变化关系,探讨了缺陷模的品质因子对光场强度的影响。 结果表明:随着夹角θ的逐渐增大,缺陷模的位置向短波方向移动,缺陷模波长的调控量为84 nm;随着夹角θ的逐渐增大, 缺陷模的品质因子逐渐增大;缺陷模在空间位置的光场分布呈现出局域现 象,随夹角θ的增大,空间位置的光场强度逐渐增强;缺陷模的品质因子与光场强度成正比关系。

The electric field direction control characteristics of one-dimensional ladder-type double-period fourth generation quasi-periodic structure defect modes with nematic liquid crystal defect layer was studied by transmission matrix method. Relationship between θ, angle of the applied electric field and incident wave direction, and position of defect mode wavelength, quality factor, optical field distribution of spatial position were analyzed. The influence of quality factors of defect modes on light field intensity was discussed. Results show that the positions of defect modes shift to short wave direction with increasing of θ, and the regulation amount of defect modes wavelength is 84 nm. The quality factors of defect modes increase gradually with increasing of θ. The optical field distribution of defect modes exhibit local phenomenon in spatial location. The light field strength of spatial location is gradually enhanced with increasing of θ. Quality factors of defect modes are proportional to the light field strength.