中国激光, 2016, 43 (5): 0514003, 网络出版: 2016-05-04   

双粒度CdSe/ZnS掺杂量子点薄膜的反射式荧光温度传感器

Reflective Fluorescence Temperature Sensor Based on Dual-Granularity CdSe/ZnS Doped Quantum Dots Thin Films
作者单位
浙江工业大学理学院光学与光电子中心, 浙江 杭州 310023
摘要
设计了一种双粒度CdSe/ZnS掺杂量子点薄膜的反射式荧光温度传感器。以发射波长分别为540 nm和610 nm的CdSe/ZnS掺杂量子点薄膜作为核心器件,研究了其光致发光光谱的峰值波长、量子点带隙、峰值强度和自参考光谱强度等参量随温度的变化特性。结果表明,在30~100 ℃的测量范围内,掺杂量子点薄膜的光致发光光谱峰值强度随着温度的增加而逐渐减小;峰值波长、量子点带隙和自参考光谱强度与温度均呈线性关系;峰值强度与温度呈指数规律关系;证明了自参考光谱强度在升温与降温的过程中具有较好的稳定性;峰值波长随温度升高出现红移,平均灵敏度可达到0.055 nm/℃。
Abstract
A reflective fluorescence temperature sensor based on the dual-granularity CdSe/ZnS doped quantum dots (QDs) thin films is designed. The CdSe/ZnS doped quantum dots thin films with the emitting wavelengths of 540 nm and 610 nm are applied to the system as a key device. The optical characteristics of photoluminescence (PL) spectra with the change of temperature between 30 ℃ to 100 ℃ are studied, such as the peak wavelengths of PL spectra, the energy bandgaps of the QDs, the peak intensity of PL spectra and the self-referenced intensity of PL spectra. Results show that, the peak intensity of PL spectra decreases gradually with the increase of temperature; the peak wavelengths of PL spectra, the energy bandgaps of the QDs and the self-referenced intensity of PL spectra vary linearly with the temperature; the peak intensity of PL spectra can be denoted by exponential function of the temperature; the stability of the self-referenced intensity of PL spectra shows good during heating and cooling; the red shift of the the peak wavelengths happens with the increase of the temperature, and the average resolution of the designed reflective fluorescence QDs temperature sensor can reach 0.055 nm/℃.

耿琰, 王河林. 双粒度CdSe/ZnS掺杂量子点薄膜的反射式荧光温度传感器[J]. 中国激光, 2016, 43(5): 0514003. Geng Yan, Wang Helin. Reflective Fluorescence Temperature Sensor Based on Dual-Granularity CdSe/ZnS Doped Quantum Dots Thin Films[J]. Chinese Journal of Lasers, 2016, 43(5): 0514003.

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