目前总积分散射测量装置都是单波长的, 不能测量复色光源的总积分散射量。先建立了一个积分球模型, 并对这个积分球模型的光源和材料进行仿真分析。光源的分析包括波长和光源面积, 材料的分析验证了该积分球模型和设定光路的可行性, 并最终根据仿真的结果对实际实验进行有效指导, 搭建了一套基于积分球的单波长总散射量测量装置, 选取了650 nm、520 nm和450 nm三个波长的半导体激光光源进行实验, 得到了多组各个不同波长下的TIS值。通过对实验结果的分析, 发现TIS值与波长的平方成反比关系, 符合总积分散射理论中TIS与波长的关系。

Total integral scattering measurement devices are single wavelength and the amount of total integral scattering of multi-color light sources can not be measured. An integral sphere model is established, the light source and the material of the model are simulated and analyzed. Light source analysis includes wavelength and light source area. By analyzing the material of the model, the feasibility of the model and light path is demonstrated. According to the final simulation result, the experiment is effectively guided to build a single wavelength total scattering measurement device based on integral sphere. The semiconductor laser light source with 650 nm, 520 nm and 450 nm is chosen to obtain groups of total integral scattering (TIS) values in different wavelength. By analyzing experimental results, TIS value is inversely proportional to the square of the wavelength, which accords with the theory of TIS.