光学 精密工程, 2016, 24 (8): 1878, 网络出版: 2016-10-19
星地两用光学表面污染检测装置
Detection device of optical surface pollution for satellite and ground
光通信 石英晶体微天平(QCM) 光学表面污染 出气速率 optical communication Quartz Crystal Microbalance (QCM) optical surface contamination outgassing rate
摘要
针对光通信终端的光学表面污染, 研制了10 MHz镀铝石英晶体微天平(QCM), 用于实时检测真空试验中的污染量以保证光通信的可靠性。该装置通过引入参考晶体消除环境因素的影响, 并降低对其控温精度的要求, 其理论质量灵敏度可达10-9g/cm2。经过绝对标定实验后, 其实际质量灵敏度为10-8g/cm2, 满足应用需求, 且成本低, 实用性好, 可用于星上或地面污染检测。文中依据不同的污染源工作温度, 分别在32 ℃高温恒温段, 32 ℃~-27 ℃降温段, 低温保持段及-2 ℃~32 ℃升温段进行了污染沉积量的检测。结果表明: 在试验初期的高温恒温段, 污染源与敏感表面温差高于0 ℃, 15.75 h内单位面积污染沉积量为1.68×10-4g/cm2; 在低温保持段, 温差一直低于-22 ℃, 23.37 h内单位面积污染解吸附量为1.08×10-4g/cm2; 真空试验的总污染沉积量为2.7×10-5 g/cm2。得到的结果证实了该QCM用于污染量检测的有效性。文中还初步分析了真空试验下的污染沉积过程, 为光学表面污染的预估与防护提供了依据。
Abstract
For the surface pollution of an optical communication terminal, a 10 MHz Aluminized Quartz Crystal Microbalance (QCM) is developed to detect the amount of deposited pollution in real time during a vacuum test. By introducing a reference crystal, the QCM eliminates the influence of environmental factors substantially, and reduces the requirements for temperature accuracy and its theoretical mass sensitivity is up to 10-9g/cm2. Through an absolute calibration experiment, the practical mass sensitivity of the QCM is 10-8g/cm2, shows a lower cost and good practicability and can be used both in satellites and on the ground. According to different operating temperatures of pollution sources, the test is divided into 32 ℃ constant temperature segment, 32 ℃ to -27 ℃ cooling segment, cryostat segment and -2 ℃ to 32 ℃ heating segment. The results show that in the high temperature segment at begin, the temperature difference between pollution source and sensitive surface is above 0 ℃,and the amount of pollution deposition per unit area is 1.68×10-4g/cm2 in 15.75 h. In the cryostat segment, the temperature difference is below -22 ℃, the amount of desorption per unit area is 1.08×10-4g/cm2 in 23.37 h. Moreover, the total amount of deposition is 2.7×10-5g/cm2 in the vacuum test. These results confirm the validity of the QCM for detecting the amount of pollution deposition, analyze the deposition process under vacuum test preliminarily and provide a gist for predicting and preventing the pollution of optical surfaces.
马晶, 朱福南, 周彦平, 柳青峰. 星地两用光学表面污染检测装置[J]. 光学 精密工程, 2016, 24(8): 1878. MA Jing, ZHU Fu-nan, ZHOU Yan-ping, LIU Qing-feng. Detection device of optical surface pollution for satellite and ground[J]. Optics and Precision Engineering, 2016, 24(8): 1878.