光谱学与光谱分析, 2016, 36 (2): 550, 网络出版: 2016-12-09   

一种基于热释电效应的X射线荧光分析谱仪

The X-Ray Fluorescence Spectrometer Based on Pyroelectric Effect
作者单位
1 中国科学院高能物理研究所, 粒子天体物理重点实验室, 北京 100049
2 中国科学院大学, 北京 100049
摘要
利用热释电晶体实现了一个X射线激发源, 并以此激发源和高能量分辨率的硅漂移探测器构建了一个X射线荧光分析谱仪。 首先通过分析计算热释电晶体厚度和靶厚度对产生X射线的影响选定了激发源的设计参数; 然后测量了激发源发射的X射线本底, 其能量范围在1~27 keV, 包含有Cu和Ta的特征X射线, 最大强度在每秒3 000个计数以上, 对本底的测量同时显示出谱仪的探测器部分对Cu的8.05 keV特征峰的分辨率达到210 eV, 具有很高的能量分辨率; 最后使用该谱仪测试了Fe, Ti和Cr等三种单质样品和高钛玄武岩样品, 测试结果表明该谱仪可以有效的分析出样品的元素成分。 由于这种X射线荧光分析谱仪的各组成部分体积都很小, 进一步便携化后非常适合于非破坏、 现场和快速的元素分析场合。
Abstract
Pyroelectric X-ray generator is implemented, and an X-ray fluorescence spectrometer is accomplished by combining the pyroelectric X-ray generator with a high energy resolution silicon drift detector. Firstly, the parameters of the X-ray generator are decided by analyzing and calculating the influence of the thickness of the pyroelectriccrystal and the thickness of the target on emitted X-ray. Secondly, the emitted X-ray is measured. The energy of emitted X-ray is from 1 to 27 keV, containing the characteristic X-ray of Cu and Ta, and the max counting rate is more than 3 000 per second. The measurement also proves that the detector of the spectrometer has a high energy resolution which the FWMH is 210 eV at 8.05 keV. Lastly, samples of Fe, Ti, Cr and high-Ti basalt are analyzed using the spectrometer, and the results are agreed with the elements of the samples. It shows that the spectrometer consisting of a pyroelectric X-ray generator and a silicon drift detector is effective for element analysis.Additionally, because each part of the spectrometer has a small volume, it can be easily modified to a portable one which is suitable for non-destructive, on-site and quick element analysis.

董亦凡, 樊瑞睿, 郭东亚, 张春雷, 高旻, 汪锦州, 刘雅清, 周大卫, 王焕玉. 一种基于热释电效应的X射线荧光分析谱仪[J]. 光谱学与光谱分析, 2016, 36(2): 550. DONG Yi-fan, FAN Rui-rui, GUO Dong-ya, ZHANG Chun-lei, GAO Min, WANG Jin-zhou, LIU Ya-qing, ZHOU Da-wei, WANG Huan-yu. The X-Ray Fluorescence Spectrometer Based on Pyroelectric Effect[J]. Spectroscopy and Spectral Analysis, 2016, 36(2): 550.

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